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Leica EM TIC 3X Triple Ion Beam Milling System w/ Leica Stereo Microscope – Surp For Sale


Leica EM TIC 3X Triple Ion Beam Milling System w/ Leica Stereo Microscope – Surp
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Leica EM TIC 3X Triple Ion Beam Milling System w/ Leica Stereo Microscope – Surp:
$3000.00

  • Leica EM TIC 3X main unit
  • Leica stereo microscope mounted on the unit for sample alignment
  • Hose (vacuum/pump connection)
  • Power cord
  • Condition:Untested. Removed from a working lab environment. Cosmetic condition is shown in the photos. Sold as-is, no returns.


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